Multifunctional precision measuring microscope

XJP-600 Multifunctional precision measuring microscope is developed and aimed at the semiconductor industry, Silicon wafer manufacuring industry, electronic information industry, metallurgical industry. As an advanced precision measuring microscope, it can be used to identify, analyze and measure structure of a variety of metal, alloy and also for detecting the semiconductor, LCD, TFT, PDP and solar cell panel. The ergonomics design makes you feel comfortable.